Wojciech Maly grāmatas
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications
Wojciech Maly, Jitendra B. Khare
-30% ar kodu BOOKS
Piegādātāja noliktavā
VLSI Design for Manufacturing: Yield Enhancement
Wojciech Maly, Stephen W Director, Andrzej J Strojwas
-30% ar kodu BOOKS
Piegādātāja noliktavā
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications
Jitendra B. Khare, Wojciech Maly
-30% ar kodu BOOKS
Piegādātāja noliktavā
VLSI Design for Manufacturing: Yield Enhancement
Wojciech Maly, Stephen W. Director, Andrzej J. Strojwas
-30% ar kodu BOOKS
Piegādātāja noliktavā