Patrick Girard grāmatas
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Patrick Girard, Arnaud Virazel, Luigi Dilillo, Alberto Bosio, Serge Pravossoudovitch
127,22 €
169,62 €
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-25%
Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Patrick Girard, Luigi Dilillo, Arnaud Virazel, Alberto Bosio, Serge Pravossoudovitch
155,25 €
207,00 €
-25% ar kodu BOOKS
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