Cher Ming Tan grāmatas
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-30%
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Yuejin Hou, Wei Li, Cher Ming Tan, Zhenghao Gan
118,57 €
169,38 €
-30% ar kodu BOOKS
Piegādātāja noliktavā
-30%
Electromigration Modeling at Circuit Layout Level
59,28 €
84,68 €
-30% ar kodu BOOKS
Piegādātāja noliktavā
-30%
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Yuejin Hou, Wei Li, Cher Ming Tan, Zhenghao Gan
118,57 €
169,38 €
-30% ar kodu BOOKS
Piegādātāja noliktavā
-30%
Graphene and VLSI Interconnects
Vivek Sangwan, Udit Narula, Cher-Ming Tan
227,38 €
324,83 €
-30% ar kodu BOOKS
Piegādātāja noliktavā
-30%
Reliability and Failure Analysis of High-Power LED Packaging
300,69 €
429,55 €
-30% ar kodu BOOKS
Piegādātāja noliktavā