Testing Sequence Dependent Defects: New Methods of Applying Two-pattern Tests and Testing Sequence Dependent Defects - Narendra Devta-Prasanna
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With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of ge ... Pilns apraksts
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Aprašymas
With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc.
Vairāk informācijas
| Autors | Narendra Devta-Prasanna |
|---|---|
| Izdevējs | LAP LAMBERT Academic Publishing |
| Izlaides gads | 2010 |
| Vāka tips | Mīkstais vāks |
| EAN | 9783838312194 |