Test Pattern Generation using Boolean Proof Engines - Daniel Tille,Stephan Eggersglüß,Görschwin Fey,Rolf Drechsler
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In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of a ... Pilns apraksts
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Aprašymas
In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
Vairāk informācijas
| Autors | Daniel Tille, Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler |
|---|---|
| Izdevējs | Springer Netherlands |
| Izlaides gads | 2010 |
| Vāka tips | Mīkstais vāks |
| EAN | 9789048184910 |