(Ipf)Microelectronic Reliability - Edward B Hakim
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Piegāde 22-28 darba dienu laikā
30 dienu atgriešanas politika
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Aprašymas
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Vairāk informācijas
| Autors | Edward B Hakim |
|---|---|
| Izdevējs | Artech House Publishers |
| Izlaides gads | 1989 |
| Vāka tips | Cietais vāks |
| EAN | 9780890062845 |