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Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Wei-Ting Kary Chien, Taeho Kim, Way Kuo
177,86 €
254,08 €
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-30%
Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Taeho Kim, Wei-Ting Kary Chien, Way Kuo
223,83 €
319,75 €
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-30%
Combat Identification Modeling Using Robust Optimization Techniques
21,77 €
31,10 €
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