Stewart E Rauch grāmatas
Nav atrasti produkti, kas atbilst izvēlei.
-30%
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Giuseppe La Rosa, Ernest Y Wu, Stewart E Rauch, Jordi Sune, Timothy D Sullivan, Rolf-Peter Vollertsen, Alvin W Strong
265,99 €
379,98 €
-30% ar kodu BOOKS
Piegādātāja noliktavā